首页> 外国专利> Non-uniform decoupling capacitor distribution for providing more uniform noise reduction across chip

Non-uniform decoupling capacitor distribution for providing more uniform noise reduction across chip

机译:非均匀的去耦电容器分布,可在整个芯片上提供更均匀的降噪

摘要

An embodiment of the present invention includes a method of providing a non-uniform distribution of decoupling capacitors to provide a more uniform noise level across the chip. Leads on a packaged semiconductor chip are grouped into two or more regions. Types of leads needing decoupling capacitors are grouped into lead categories. For each region, there may be one or more lead categories therein. One or more decoupling capacitors are preferably assigned to each lead category in each region. Calculations may be performed to estimate a desired capacitance for each decoupling capacitor for each lead category in each region. When a chip has different components operating at different switching frequencies, different voltages, and/or different switching currents, the distribution of the decoupling capacitors will likely be non-uniform to provide a more uniform noise level across the chip, as compared to a uniform distribution of decoupling capacitors for the chip.
机译:本发明的实施例包括提供去耦电容器的非均匀分布以在芯片上提供更均匀的噪声水平的方法。封装的半导体芯片上的引线分为两个或更多区域。需要去耦电容器的引线类型分为引线类别。对于每个区域,其中可能有一个或多个潜在客户类别。优选在每个区域中为每个引线类别分配一个或多个去耦电容器。可以进行计算以估计每个区域中每个引线类别的每个去耦电容器的期望电容。当芯片具有在不同的开关频率,不同的电压和/或不同的开关电流下工作的不同组件时,去耦电容器的分布很可能会不均匀,从而与整个芯片相比,在整个芯片上提供的噪声电平会更加均匀分配芯片的去耦电容器。

著录项

  • 公开/公告号US7080337B2

    专利类型

  • 公开/公告日2006-07-18

    原文格式PDF

  • 申请/专利权人 THANH T. TRAN;

    申请/专利号US20030749501

  • 发明设计人 THANH T. TRAN;

    申请日2003-12-31

  • 分类号G06F17/50;

  • 国家 US

  • 入库时间 2022-08-21 21:43:50

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