Method and apparatus for the analysis and optimization of variability in nanometer technologies

摘要

A method and apparatus are presented that can analyze the performance of an integrated circuit design at multiple corners, under multiple modes, and for multiple objectives efficiently and simultaneously. The extraction, timing analysis, and optimization functions are integrated into a mechanism that provides a novel problem formulation. A plurality of virtual timing graphs are maintained and updated simultaneously by providing a data structure that can efficiently store operating data for an arbitrary number of conditions at each node. This data structure is populated according to the design, and as optimizations are made, the operating data for all design conditions is updated simultaneously. Timing violations can be reported across all corners and modes. By integrating this multi-corner multi-mode analysis with circuit optimization, a convergent mechanism is provided. In this way, design constraints are evaluated simultaneously for an arbitrary number of design conditions.