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Infrared absorption measurement method, infrared absorption measurement device, and method of manufacturing semiconductor device

机译:红外线吸收率测定方法,红外线吸收率测定装置以及半导体装置的制造方法

摘要

An infrared absorption measurement method including: (a) measuring infrared absorption of a target component in a sample gas while decompressing the sample gas so that an absorption area in a peak region of the target component in the infrared absorption shown in a graph is within a predetermined range, the graph showing the relationship between the wave number and absorbance of the sample gas; and (b) calculating the concentration of the target component in the sample gas based on the absorption area and pressure of the decompressed sample gas.
机译:一种红外线吸收率的测定方法,包括:(a)一边使试样气体减压,一边测定试样气体中的目标成分的红外线吸收率,以使图中所示的红外线吸收率中的目标成分的峰区域的吸收面积在a以下。在规定范围内,曲线图示出了样气的波数与吸光度之间的关系。 (b)根据吸收后的样品气体的吸收面积和压力,计算样品气体中的目标成分的浓度。

著录项

  • 公开/公告号US7067813B2

    专利类型

  • 公开/公告日2006-06-27

    原文格式PDF

  • 申请/专利权人 ISAMU NAMOSE;

    申请/专利号US20040756316

  • 发明设计人 ISAMU NAMOSE;

    申请日2004-01-14

  • 分类号G01N21/61;

  • 国家 US

  • 入库时间 2022-08-21 21:42:26

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