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Infrared absorption measurement method, infrared absorption measurement device, and method of manufacturing semiconductor device

机译:红外线吸收率测定方法,红外线吸收率测定装置以及半导体装置的制造方法

摘要

An infrared absorption measurement method includes: (a) measuring infrared absorption of a measurement target component in a state in which a sample gas including the measurement target component is decompressed; (b) calculating an absorption area in a peak region of the measurement target component in the infrared absorption shown in a graph which shows the relationship between the wave number and absorbance of the sample gas; and (c) calculating a concentration of the measurement target component in the sample gas based on the absorption area and pressure of the sample gas during decompression.
机译:红外线吸收率的测定方法包括:(a)在对包含测定对象成分的试样气体进行减压的状态下,测定测定对象成分的红外线吸收率。 (b)计算曲线图所示的红外吸收率中的测定对象成分的峰区域的吸收面积,该曲线图示出了波数与试样气体的吸收率之间的关系。 (c)根据减压时的试样气体的吸收面积和压力,算出试样气体中的测定对象成分的浓度。

著录项

  • 公开/公告号US7057175B2

    专利类型

  • 公开/公告日2006-06-06

    原文格式PDF

  • 申请/专利权人 ISAMU NAMOSE;

    申请/专利号US20040756413

  • 发明设计人 ISAMU NAMOSE;

    申请日2004-01-14

  • 分类号G01J5/02;G01N9/00;G01N19/10;G01N21/00;G01N25/00;G01N27/00;G01N29/02;

  • 国家 US

  • 入库时间 2022-08-21 21:41:19

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