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Method of predicting quiescent current variation of an integrated circuit die from a process monitor derating factor
Method of predicting quiescent current variation of an integrated circuit die from a process monitor derating factor
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机译:根据过程监控器降额因子预测集成电路管芯静态电流变化的方法
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摘要
In exemplary embodiments, a method and computer program product for predicting quiescent current variation of an integrated circuit die include steps of: (a) receiving as input a value of a derating factor from a process monitor cell on an integrated circuit die and an on-chip variation of the derating factor; (b) constructing a curve fitting formula for estimating a quiescent current of the integrated circuit die as a function of the derating factor; (c) calculating minimum and maximum values of the quiescent current from the curve fitting formula, the value of the derating factor from the process monitor cell, and the on-chip variation of the derating factor to generate an estimate of minimum and maximum values for the quiescent current; and (d) generating as output the estimated minimum and maximum values of the quiescent current.
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