首页> 外国专利> Polishing pad refurbisher for in situ, real-time conditioning and cleaning of a polishing pad used in chemical-mechanical polishing of microelectronic substrates

Polishing pad refurbisher for in situ, real-time conditioning and cleaning of a polishing pad used in chemical-mechanical polishing of microelectronic substrates

机译:抛光垫翻新机,用于对微电子基板的化学机械抛光中使用的抛光垫进行原位,实时调节和清洁

摘要

A pad refurbisher that provides in situ, real-time conditioning and/or cleaning of a polishing surface on a polishing pad used in chemical-mechanical polishing of a semiconductor wafer and other microelectronic substrates. The pad refurbisher has a body adapted for attachment to a wafer carrier of a chemical-mechanical polishing machine, and a refurbishing element connected to the body. The body has a distal face positioned proximate to a perimeter portion of the wafer carrier and facing generally toward the polishing surface of the polishing pad. The body travels with the wafer carrier as the wafer carrier moves over the polishing pad. The refurbishing element is connected to the distal face of the body so that the refurbishing element can operatively engage the polishing surface substantially adjacent to the perimeter of the wafer carrier. The refurbishing element is a pad conditioning device and/or a pad cleaning device that conditions and/or cleans the polishing surface of the pad to remove waste particles from the polishing surface of the polishing pad and place the pad in a desired polishing condition. In operation, the refurbishing element travels with the wafer carrier and is selectively engaged with the polishing surface while the wafer carrier presses the wafer against the polishing surface to selectively condition and/or clean generally only the deteriorated areas on the pad.
机译:一种垫翻新机,可对半导体晶片和其他微电子基板的化学机械抛光中使用的抛光垫上的抛光表面进行原位,实时调节和/或清洁。垫翻新机具有适于附接到化学机械抛光机的晶片载体的主体,以及连接至该主体的翻新元件。主体具有远侧表面,该远侧表面位于晶片载体的周边部分附近并且通常面向抛光垫的抛光表面。当晶片载体在抛光垫上移动时,主体随晶片载体一起移动。整修元件连接到主体的远侧表面,使得整修元件可以可操作地接合基本上邻近晶片载体的周边的抛光表面。翻新元件是垫调节装置和/或垫清洁装置,其调节和/或清洗垫的抛光表面以从抛光垫的抛光表面去除废物颗粒并将垫置于期望的抛光条件下。在操作中,翻新元件与晶片载体一起行进并且选择性地与抛光表面接合,同时晶片载体将晶片压在抛光表面上以仅选择性地调节和/或清洁垫上的劣化区域。

著录项

  • 公开/公告号USRE39195E

    专利类型

  • 公开/公告日2006-07-18

    原文格式PDF

  • 申请/专利权人 TRUNG T. DOAN;GURTEJ S. SANDHU;

    申请/专利号US20010054692

  • 发明设计人 GURTEJ S. SANDHU;TRUNG T. DOAN;

    申请日2001-12-19

  • 分类号B24B7/08;

  • 国家 US

  • 入库时间 2022-08-21 21:41:27

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