Method for diagnosing open defects on non-contacted nodes of an electronic device from measurements of capacitively coupled nodes

摘要

A method and apparatus for diagnosing open defects on non-contacted nodes of an electrical device is presented. Actual and expected signal measurements are collected for various contacted nodes of the electrical device. Nodes whose actual measurements are out of range of their respective expected measurements are deemed abnormal nodes. Non-contacted nodes may then be assessed as having, or as likely to have, open defects based on knowledge of the degree of coupling of the non-contacted node to the abnormal contacted nodes. In the preferred embodiment, abnormal nodes are identified using a linear regression analysis, and the non-contacted nodes indicted as having open defects are identified using a weighting scheme.