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CMOS-type photodetector for improved charge transfer from the photodetector to a MOS transistor

机译:CMOS型光电探测器,可改善从光电探测器到MOS晶体管的电荷转移

摘要

A photodetector formed in an active area of a semiconductor substrate of a first conductivity type, including a MOS transistor and a photodiode formed of the junction between the substrate and a region of a second conductivity type also forming the source of the MOS transistor, a heavily-doped layer of the first conductivity type covering the source region and a portion of the substrate, said portion of the substrate being delimited by an opening of the source region extending in a centered manner from the side of the source region opposite to the channel region of the transistor, towards this channel region.
机译:在第一导电类型的半导体衬底的有源区域中形成的光电检测器,包括MOS晶体管和由衬底与第二导电类型的区域之间的结形成的光电二极管,该光电二极管也形成了MOS晶体管的源极,覆盖源极区和部分衬底的第一导电类型的掺杂层,衬底的所述部分由源极区的开口定心地从源极区的与沟道区相反的一侧延伸晶体管的这个沟道区域。

著录项

  • 公开/公告号US6984817B2

    专利类型

  • 公开/公告日2006-01-10

    原文格式PDF

  • 申请/专利权人 YVON CAZAUX;

    申请/专利号US20020142259

  • 发明设计人 YVON CAZAUX;

    申请日2002-05-09

  • 分类号H01L31/00;

  • 国家 US

  • 入库时间 2022-08-21 21:40:34

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