首页> 外国专利> CAPACITOR CONSTRUCTIONS, RUGGED SILICON-CONTAINING SURFACES, AND METHODS OF FORMING RUGGED SILICON-CONTAINING SURFACES

CAPACITOR CONSTRUCTIONS, RUGGED SILICON-CONTAINING SURFACES, AND METHODS OF FORMING RUGGED SILICON-CONTAINING SURFACES

机译:电容器构造,成块的含硅表面以及形成成块的含硅表面的方法

摘要

The invention encompasses a method of forming a rugged silicon-containing surface.A layer comprising amorphous silicon is provided within a reaction chamber ata first temperature. The temperature is increased to a second temperature atleast 400 C higher than the first temperature while flowing at leastone hydrogen isotope into the chamber. After the temperature reaches the secondtemperature, the layer is seeded with seed crystals. The seeded layer is thenannealed to form a rugged silicon-containing surface. The rugged silicon-containingsurface can be incorporated into a capacitor construction. The capacitor constructioncan be incorporated into a DRAM cell, and the DRAM cell can be utilized in an electronicsystem.
机译:本发明包括一种形成粗糙的含硅表面的方法。包含非晶硅的层设置在反应室内第一温度。温度升高到第二个温度至少流动至少比第一温度高400 C一个氢同位素进入反应室。温度达到第二级之后温度下,该层上种有种晶。然后是种子层退火以形成粗糙的含硅表面。坚固的含硅表面可以并入电容器构造中。电容器构造可以将其结合到DRAM单元中,并且该DRAM单元可以用于电子系统。

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