MEMORY DEFECT REDRESS ANALYSIS TREATING METHOD, AND MEMORY TESTING APPARATUS PERFORMING THE METHOD

摘要

It provides a memory testing apparatus including the defect remedy analysis processing unit for performing a shortened time required for defect redundancy of a redundant configuration of the memory dabiteu resolving defect remedy analysis method, and a method.; These multiple remedy analysis unit is installed, and by parallel operation of the plurality of relief analysis unit at the same time, relief analysis processing of the defective memory cell of the plurality of data bits to be read out from the defect analysis memory for a common failure analysis memory and run in parallel at the same time in a plurality of relief analysis unit, and shortening the time required for defect remedy analysis process.