TEST APPARATUS FOR SMART CARD CHIPS AND TESTING METHOD OF THE SAME

摘要

The present invention during wafer sort test of having the smart card chip, to generate information for each chip, , writing is directed to a test device and method for preventing accidents process. When the test device is testing the first sort, generating information for each chip in the user memory area of the chip, and writes. The information on the chip is a wafer lot ID, wafer number and chip coordinate information, to be applied in the subsequent step is stored as a single information. Therefore, the test apparatus when generating the first sort test, the use in a subsequent test process using the information stored on the chip, due to operator error or equipment is loaded on a wafer carrier or wafer suitable for processing sequence proceeds, the position of the chip to prevent accidents that could occur if the process shifts to be.