首页> 外国专利> METHOD FOR MEASURING THE CHARACTERISTICS OF SKIN WITH ABSORPTION, SCATTERING AND DIFFUSE REFLECTANCE PROFERTIES OF LIGHT

METHOD FOR MEASURING THE CHARACTERISTICS OF SKIN WITH ABSORPTION, SCATTERING AND DIFFUSE REFLECTANCE PROFERTIES OF LIGHT

机译:用光的吸收,散射和漫反射特性测量皮肤特征的方法

摘要

A method for measuring characteristics of animal skin is provided to measure the characteristics of the skin by using variations of intensity and wavelength of light absorbed, scattered and diffused from the skin. A light of a specified wavelength is irradiated on a skin from a light source. Variations of intensity and wavelength of the light absorbed, scattered, and diffused from the skin are measured by a sensor. The data obtained from the step of measuring the variations of intensity and wavelength of the light is analyzed to measure characteristics of the skin. The wavelength of the light is a range of visible rays. The sensor is a CMOS or CCD image sensor.
机译:提供一种用于测量动物皮肤特性的方法,以通过使用从皮肤吸收,散射和扩散的光的强度和波长的变化来测量皮肤的特性。特定波长的光从光源照射到皮肤上。从皮肤吸收,散射和扩散的光的强度和波长的变化由传感器测量。分析从测量光的强度和波长的变化的步骤中获得的数据,以测量皮肤的特性。光的波长是可见光的范围。传感器是CMOS或CCD图像传感器。

著录项

  • 公开/公告号KR20060115478A

    专利类型

  • 公开/公告日2006-11-09

    原文格式PDF

  • 申请/专利权人 PLANET82 CO. LTD.;

    申请/专利号KR20050037914

  • 发明设计人 KIM HOON;

    申请日2005-05-06

  • 分类号A61B5;

  • 国家 KR

  • 入库时间 2022-08-21 21:24:33

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