Spice simulation system for diode and method of simulation using the same

摘要

A system and method for simulating a diode device measures electrical characteristics of a plurality of diodes; normalizes the measured electrical characteristics of the diode; extracts a plurality of device parameters of each of the diodes from the normalized characteristics; converts the device parameters of each of the diodes to values per unit area; obtains a linear equation from the converted device parameters; and predicts electrical characteristics of certain diode area from the linear equation and the device parameters. The linear equation is obtained by a least square method of the regression analysis to extract the device parameters of each of the diodes which are converted to value per unit area. The device parameters are obtained by a simultaneous equation which is derived from both a diode having larger area component and a diode having greater length component.