METHOD FOR RAPID ANALYSIS OF SOLID SAMPLES FOR photoelectron spectrometer

摘要

1.a way to express analysis of solid-state samples in the u0444u043eu0442u043eu044du043bu0435u043au0442u0440u043eu043du043du043eu043c gcms, including mechanical processing model and its installation in the working chamber, tci u0430u0447u043au0443 vacuum it, cleaning the surface of the sample pulse ionizing radiation, the separation of pulses in u044du043du0435u0440u0433u043eu0430u043du0430u043bu0438u0437u0430u0442u043eu0440u0435, registration of a child u043au0442u043eu0440u043eu043c and processing of spectrum, u043eu0442u043bu0438u0447u0430u044eu0449u0438u0439u0441u00a0 orderworking chamber formed by u0440u0430u0437u043cu0435u0449u0435u043du0438u00a0 device type "sucker" u043fu0440u043eu0442u00a0u0436u0435u043du043du043eu043c sample pumping vacuum u043eu0441u0443u0449u0435u0441u0442u0432u043bu00a0u044eu0442 to u0434u0430u0432u043bu0435u043du0438u00a0 10 - 6 to 10 - 5 torr, sweep over each sample u043fu0440u043eu0438u0437u0432u043eu0434u00a0u0442 within 0.01 - 0.1, and the sample pulse radiation ionising radiation start simultaneously with the end of his cleansing.;2. a way to express analysis of solid-state samples in the u0444u043eu0442u043eu044du043bu0435u043au0442u0440u043eu043du043du043eu043c gcms for 1, u043eu0442u043bu0438u0447u0430u044eu0449u0438u0439u0441u00a0, small in u043fu0440u043eu0442u00a0u0436u0435u043du043du043eu0441u0442u0438 sample without u0440u0430u0437u0440u0443u0448u0435u043du0438u00a0 u043fu0440u0438u043au0440u0435 u043fu043bu00a0u044eu0442 on a substrate, and a working chamber formed by u0440u0430u0437u043cu0435u0449u0435u043du0438u00a0 device type "sucker" is prominent.;3. a way to express analysis of solid-state samples in the u0444u043eu0442u043eu044du043bu0435u043au0442u0440u043eu043du043du043eu043c gcms for 1 or 2, u043eu0442u043bu0438u0447u0430u044eu0449u0438u0439u0441u00a0 so that cleaning the surface before the radiation of the idi u0443u043bu044cu0441u043du044bu043c ionising radiation u043eu0441u0443u0449u0435u0441u0442u0432u043bu00a0u044eu0442 ionic beam section, completely covering the u0438u0441u0441u043bu0435u0434u0443u0435u043cu0443u044e area.;4. a way to express analysis of solid-state samples in the u0444u043eu0442u043eu044du043bu0435u043au0442u0440u043eu043du043du043eu043c gcms for 2, u043eu0442u043bu0438u0447u0430u044eu0449u0438u0439u0441u00a0, cleaning the surface of the radiation pulse u043eu0441u0443u0449u0435u0441u0442u0432u043bu00a0u044eu0442 u043au043eu043bu0435u0431u0430u043du0438u00a0u043cu0438 ionising radiation and ultrasound.