A process for the contactless determination of a layer thickness by resistance - and inductance measurement of a sensor coil

摘要

In the case of a process for the contactless determination of a thickness of a layer (20) of electrically conductive material of a component (17), a sensor comprising a coil body (13) and a coil (14) in the vicinity of the component to be measured (17) positioned. The method is based on a combination of inductively - and eddy current. A plurality of measuring - and evaluation steps in which the coil (14) with an alternating current frequency f is acted upon and their inductance - and resistance values are evaluated, lead to the determination of the thickness of the layer (20). In this case, the distance between the coil body (13), and thus of the coil (14), and the component (17) of the resistance r of the with the alternating current frequency f being loaded coil (14) is derived.