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Interferometric simultaneous measurement of the topography and refractive index of the surface of an object by measuring the spatial phase distributions from both transmission and reflection interferograms

机译:通过测量透射和反射干涉图的空间相位分布,同时测量物体表面的形貌和折射率的干涉测量

摘要

Interferometry method for determining the topography and refractive index distribution of the surface of an object (3) has the following steps: simultaneous measurement of a transmission interferogram and reflection interferogram, reconstruction of spatial phase distributions from both the transmission and reflection interferograms and determination of the topography and refractive index distribution for the object from the two phase distributions. An independent claim is made for an interferometer for determining the topography and refractive index distribution of the surface of an object.
机译:用于确定物体表面的形貌和折射率分布的干涉测量方法(3)包括以下步骤:同时测量透射干涉图和反射干涉图,从透射干涉图和反射干涉图重建空间相位分布并确定从两个相位分布中得出物体的形貌和折射率分布。干涉仪具有独立的权利要求,用于确定物体表面的形貌和折射率分布。

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