首页> 外国专利> Electron-beam deposition system, has trailing-indicator monitor measuring past evaporation performance of evaporation source, and leading-indicator monitor measuring future evaporation performance of evaporation source

Electron-beam deposition system, has trailing-indicator monitor measuring past evaporation performance of evaporation source, and leading-indicator monitor measuring future evaporation performance of evaporation source

机译:电子束沉积系统,具有跟踪指标监视器,用于测量蒸发源的过去蒸发性能,以及领先指标监视器,用于测量蒸发源的未来蒸发性能。

摘要

The system has a trailing-indicator monitor (40) measuring a past evaporation performance of an evaporation source and has a trailing-indicator output. A leading-indicator monitor (62) measures a future evaporation performance of the source and has a leading-indicator output. A controller receives both the outputs, and controls an electron-beam source responsive to the trailing output and to the leading-indicator output.
机译:该系统具有测量蒸发源的过去蒸发性能的尾随指示器监控器(40),并且具有尾随指示器输出。领先指标监视器(62)测量源的未来蒸发性能,并具有领先指标输出。控制器接收两个输出,并响应于尾随输出和前导指示器输出来控制电子束源。

著录项

  • 公开/公告号DE102006003108A1

    专利类型

  • 公开/公告日2006-08-03

    原文格式PDF

  • 申请/专利权人 RAYTHEON COMPANY;

    申请/专利号DE20061003108

  • 发明设计人 GABURA ANDREW J.;HARRIS GEOFFREY G.;

    申请日2006-01-18

  • 分类号H01J37/304;H01J37/32;C23C14/30;

  • 国家 DE

  • 入库时间 2022-08-21 21:20:08

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