Device for adjustment of illuminant in microscopy has adjustment element which is provided in insertion region of incident light beam bath in observation beam path of microscope

摘要

The device has adjustment element (2) which is provided in the insertion region of the incident light bath (1) in observation beam path (45) of a microscope. A deflection element (3) arranged in the adjustment element deflects the illuminating light of a illuminant from the incident light path directly in the observation beam path. An imaging optical system (8) images luminous spot of the illuminant in a intermediate image plane (10).