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process for producing dielectric layers with low dielectric constant for beol lines with improved adhesion and low fehlerdichte

机译:用于制备具有改进的粘附力和低费力的beol线的低介电常数介电层的方法

摘要

A substantially defect-free, low-k dielectric film having improved adhesion is provided by (a) applying a silane coupling agent containing at least one polymerizable group to a surface of a substrate so as to provide a substantially uniform coating of said silane-coupling agent on said substrate; (b) heating the substrate containing the coating of the silane-coupling agent at a temperature of about 90° C. or above so as to provide a surface containing Si-O bonds; (c) rinsing the heated substrate with a suitable solvent that is effective in removing any residual silane-coupling agent; and (d) applying a dielectric material to the rinsed surface containing the Si-O bonds.
机译:通过(a)将包含至少一个可聚合基团的硅烷偶联剂施加到基底的表面上以提供基本上均匀的所述硅烷偶联剂的涂层,从而提供具有改善的粘附力的基本上无缺陷的低k介电膜。所述基质上的试剂; (b)在约90℃或更高的温度下加热包含硅烷偶联剂涂层的基材,以提供包含Si-O键的表面; (c)用能有效除去任何残留硅烷偶联剂的合适溶剂冲洗加热的基材; (d)将电介质材料施加到含有Si-O键的冲洗过的表面上。

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