首页> 外国专利> METHOD OF MANUFACTURING MICROPROBE GUIDE, MICROPROBE UNIT USING MICROPROBE GUIDE, AND STAGGERED TYPE MICROPROBE UNIT

METHOD OF MANUFACTURING MICROPROBE GUIDE, MICROPROBE UNIT USING MICROPROBE GUIDE, AND STAGGERED TYPE MICROPROBE UNIT

机译:制造微探针导杆的方法,使用微探针导杆的微探针单元以及交错式微探针单元

摘要

PPROBLEM TO BE SOLVED: To guide a probe highly accurately, and to narrow a pitch of tip arrangement of each probe, in a probe unit. PSOLUTION: A staggered type microprobe unit 40 is constituted by combining back to back an upper side microprobe unit 42 and a lower side microprobe unit 44. The upper side microprobe unit 42 is constituted of a microprobe guide 70 having a plurality of grooves 72, and microprobes 50 arranged respectively on each groove 72. The lower side microprobe unit 44 has a similar configuration. The microprobe guides 70, 71 having the plurality of grooves 72 are acquired by forming each elongate deep groove having the groove depth and the groove width corresponding to the height and the width of a shaft part of the microprobes 50, 51 by using an anisotropic dry etching method to a silicon plate. PCOPYRIGHT: (C)2008,JPO&INPIT
机译:

要解决的问题:在探头单元中高精度地引导探头并缩小每个探头的尖端排列的间距。

解决方案:交错型微探针单元40通过背对背组合上侧微探针单元42和下侧微探针单元44而构成。上侧微探针单元42由具有多个凹槽的微探针引导件70构成。另外,在各槽72上分别配置有图72所示的微探针50和微探针50。下侧微探针单元44具有相同的结构。通过使用各向异性干燥形成具有与微探针50、51的轴部的高度和宽度相对应的沟槽深度和沟槽宽度的每个细长深沟槽,从而获得具有多个沟槽72的微探针引导件70、71。硅板的蚀刻方法。

版权:(C)2008,日本特许厅&INPIT

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