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SCANNING PROBE MICROSCOPE AND METHOD FOR ACQUIRING IMAGE REFLECTING PHYSICAL PROPERTY VALUE OF SPECIMEN

机译:扫描探针显微镜及获取反映样品物理性能值的方法

摘要

PROBLEM TO BE SOLVED: To provide a scanning probe microscope for acquiring, in a short time, a plurality of images which reflect the physical property values of a sample unaffected by temperature drift.;SOLUTION: In first acquiring an image reflecting the physical property values of the sample, a probe 21 is scanned two-dimensionally by an XYZ scanner 12, to acquire three-dimensional information on the specimen S. A probe scanning track is calculated by a calculation part 25, based on the direction of the two-dimensional scanning and on the three-dimensional information. The calculated scanning track is stored in a memory 27, and the probe 21 is scanned along the scanning track by the XYZ scanner 12, to acquire an image reflecting the physical property values of the sample; and in acquiring an image that reflects the physical property values of the specimen thereafter, the probe 21 is scanned by the XYZ scanner 12, along the scanning track stored in the memory 27 to acquire an image reflecting the physical property values of the sample S.;COPYRIGHT: (C)2008,JPO&INPIT
机译:要解决的问题:提供一种扫描探针显微镜,以在短时间内获取多个图像,这些图像反映不受温度漂移影响的样品的物理性质值。;解决方案:首先获取反映物理性质值的图像在样本中,探针21被XYZ扫描仪12二维扫描,以获取关于样本S的三维信息。探针计算轨迹由计算部25基于二维方向来计算。扫描和关于三维信息。计算出的扫描轨迹被存储在存储器27中,探针21被XYZ扫描仪12沿着该扫描轨迹扫描,从而获取反映样品的物性值的图像。然后,在获取反映样本的物理性质值的图像时,由XYZ扫描仪12沿着存储在存储器27中的扫描轨迹扫描探针21,从而获取反映样本S的物理性质值的图像。 ;版权:(C)2008,日本特许厅和INPIT

著录项

  • 公开/公告号JP2007278896A

    专利类型

  • 公开/公告日2007-10-25

    原文格式PDF

  • 申请/专利权人 OLYMPUS CORP;

    申请/专利号JP20060106595

  • 发明设计人 KAKEMIZU TAKAHIKO;

    申请日2006-04-07

  • 分类号G01N13/10;

  • 国家 JP

  • 入库时间 2022-08-21 21:15:47

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