PROBLEM TO BE SOLVED: To test durability with respect to heat and light, by radiating light to a sample placed at a high temperature of 120°C or higher.;SOLUTION: This heat-resistance light-resistance testing device comprises a test tub 10 for placing the sample S at the high temperature of 120°C or higher, a light source chamber 20 storing a light source 21 for radiating the light to the sample S, and a partition board 30 for separating the test tub 10 from the light source chamber 20 so as to break heat and transmit the light. The partition board 30 has at least double light transmission plate, installed on both sides of a cavity. The light source 21 with not be damaged, even if the test tub 10 is heated to a high temperature of 120°C or higher, and hence the durability with respect to the heat and light of the sample S, placed at a high temperature of 120°C or higher, can be tested appropriately.;COPYRIGHT: (C)2007,JPO&INPIT
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