首页> 外国专利> METHOD OF FORMING INTERLAYER INSULATION FILM, PRECURSOR SOLUTION FOR FORMING INTERLAYER INSULATION FILM, CVD MATERIAL FOR FORMING INTERLAYER INSULATION FILM, AND MATERIAL FOR FORMING SILOXANE OLIGOMER

METHOD OF FORMING INTERLAYER INSULATION FILM, PRECURSOR SOLUTION FOR FORMING INTERLAYER INSULATION FILM, CVD MATERIAL FOR FORMING INTERLAYER INSULATION FILM, AND MATERIAL FOR FORMING SILOXANE OLIGOMER

机译:形成层间绝缘膜的方法,形成层间绝缘膜的前驱体,形成层间绝缘膜的CVD材料以及形成硅氧烷低聚物的材料

摘要

PPROBLEM TO BE SOLVED: To provide a method of forming an interlayer insulation film which has a superior mechanical strength and has a low dielectric constant. PSOLUTION: In the method of forming the interlayer insulation film by plasma CVD, an organic siloxane compound including one or more silicon atoms, each including at least three units expressed by a general expression -O-Si(RSP1/SPRSP2/SP)-ORSP3/SP, where RSP1/SPand RSP2/SPare the same or different kinds and are either methyl groups, ethyl groups, or propyl groups and RSP3/SPis the same kind as or different kind from RSP1/SPand RSP2/SPand is either a methyl group, an ethyl group, a propyl group, or a phenyl group, is used as a material. PCOPYRIGHT: (C)2007,JPO&INPIT
机译:

要解决的问题:提供一种形成层间绝缘膜的方法,该层间绝缘膜具有优异的机械强度并且具有低介电常数。

解决方案:在通过等离子体CVD形成层间绝缘膜的方法中,有机硅氧烷化合物包括一个或多个硅原子,每个硅原子包含至少三个由通式-O-Si(R 1)表示的单元。 R 2 )-OR 3 ,其中R 1 和R 2 相同或不同种类,可以是甲基,乙基或丙基,并且R 3 与R 1 和R 2 并且是甲基,乙基,丙基或苯基中的任一种用作材料。

版权:(C)2007,日本特许厅&INPIT

著录项

  • 公开/公告号JP2007005572A

    专利类型

  • 公开/公告日2007-01-11

    原文格式PDF

  • 申请/专利权人 MATSUSHITA ELECTRIC IND CO LTD;

    申请/专利号JP20050184247

  • 发明设计人 AOI NOBUO;

    申请日2005-06-24

  • 分类号H01L21/312;C23C16/42;H01L21/316;

  • 国家 JP

  • 入库时间 2022-08-21 21:14:52

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