首页> 外国专利> METHOD AND SYSTEM OF EVALUATING SURFACE ROUGHNESS OF IMAGE FORMING APPARATUS COMPONENT, AND METHOD AND SYSTEM FOR CUTTING

METHOD AND SYSTEM OF EVALUATING SURFACE ROUGHNESS OF IMAGE FORMING APPARATUS COMPONENT, AND METHOD AND SYSTEM FOR CUTTING

机译:评估图像形成装置组件的表面粗糙度的方法和系统以及切割方法和系统

摘要

PROBLEM TO BE SOLVED: To highly sensitively and correctly know a local change or modification of a surface to be measured in measuring surface roughness of an image forming apparatus component such as a substratum for use of an electrophotographic photoreceptor.;SOLUTION: A profile curve defined in JIS B0601 is calculated on a surface condition of the image forming apparatus component such as the electrophotographic photoreceptor substratum. Multiple resolution analysis such as wavelet transformation of a positional data row in the surface roughness direction at equal intervals on the profile curve is performed, and the surface roughness condition is evaluated based on the results.;COPYRIGHT: (C)2008,JPO&INPIT
机译:解决的问题:为了高度敏感和正确地知道在测量成像设备部件(如用于电子照相感光体的底层)的表面粗糙度时要测量的表面的局部变化或修饰。 JIS B0601中的“ A”是根据图像形成装置部件(例如电子照相感光体基体)的表面条件来计算的。进行多分辨率分析,例如在轮廓曲线上以等间隔对表面数据方向上的位置数据行进行小波变换,并根据结果评估表面粗糙度条件。;版权:(C)2008,JPO&INPIT

著录项

  • 公开/公告号JP2007292772A

    专利类型

  • 公开/公告日2007-11-08

    原文格式PDF

  • 申请/专利权人 RICOH CO LTD;

    申请/专利号JP20070119975

  • 发明设计人 YAMAZAKI JUNICHI;

    申请日2007-04-27

  • 分类号G01B21/30;G03G5/00;G03G5/10;G03G21/00;

  • 国家 JP

  • 入库时间 2022-08-21 21:14:08

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