首页> 外国专利> METHOD AND SYSTEM FOR EVALUATING SURFACE ROUGHNESS OF COMPONENT FOR IMAGE FORMING DEVICE, AND METHOD AND SYSTEM FOR CUTTING

METHOD AND SYSTEM FOR EVALUATING SURFACE ROUGHNESS OF COMPONENT FOR IMAGE FORMING DEVICE, AND METHOD AND SYSTEM FOR CUTTING

机译:用于评估图像形成装置的部件的表面粗糙度的方法和系统,以及用于切割的方法和系统

摘要

PROBLEM TO BE SOLVED: To provide a surface roughness evaluating method for sensitively and accurately comprehending a local change or variation of a surface to be measured, in surface roughness measurement of a component for an image forming device such as a base substance for an electrophotography photoreceptor.;SOLUTION: According to this surface roughness evaluating method of a component for an image forming device, a cross- section curve defined by JIS B0601 is found on the surface condition of the component to perform multiple resolution analysis on positional data rows in a surface roughness direction at equally spaced positions on the cross-section curve, and the state of the surface roughness is evaluated at least based on the result.;COPYRIGHT: (C)2004,JPO
机译:解决的问题:提供一种表面粗糙度评估方法,该方法用于在成像装置的部件(例如,电子照相感光体的基础物质)的表面粗糙度测量中灵敏且准确地理解待测量表面的局部变化或变化。解决方案:根据该图像形成装置的部件的表面粗糙度评估方法,在部件的表面条件下找到由JIS B0601定义的横截面曲线,以对表面中的位置数据行进行多分辨率分析。至少根据结果评估横截面曲线上等距位置处的粗糙度方向,并评估表面粗糙度的状态。;版权:(C)2004,JPO

著录项

  • 公开/公告号JP2004061359A

    专利类型

  • 公开/公告日2004-02-26

    原文格式PDF

  • 申请/专利权人 RICOH CO LTD;

    申请/专利号JP20020221511

  • 发明设计人 YAMAZAKI JUNICHI;

    申请日2002-07-30

  • 分类号G01B21/30;G03G5/00;G03G5/10;G03G21/00;

  • 国家 JP

  • 入库时间 2022-08-21 23:28:50

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号