首页> 外国专利> POLISHING SLURRY, SURFACE TREATMENT METHOD OF GROUP III NITRIDE CRYSTAL, GROUP III NITRIDE CRYSTAL SUBSTRATE, GROUP III NITRIDE CRYSTAL SUBSTRATE WITH EPITAXIAL LAYER, SEMICONDUCTOR DEVICE AND ITS FABRICATION PROCESS

POLISHING SLURRY, SURFACE TREATMENT METHOD OF GROUP III NITRIDE CRYSTAL, GROUP III NITRIDE CRYSTAL SUBSTRATE, GROUP III NITRIDE CRYSTAL SUBSTRATE WITH EPITAXIAL LAYER, SEMICONDUCTOR DEVICE AND ITS FABRICATION PROCESS

机译:Ⅲ族氮化物,Ⅲ族氮化物,表皮层,半导体装置及其制造工艺的抛光泥浆,表面处理方法

摘要

PROBLEM TO BE SOLVED: To provide polishing slurry which can form a smooth surface with little potential flaw efficiently on a group III nitride crystal, and to provide a surface treatment method of the group III nitride crystal employing polishing slurry.;SOLUTION: Polishing slurry performing the chemical mechanical polishing of the surface of a group III nitride crystal contains abrasive grains having hardness not higher than that of the group III nitride crystal wherein the abrasive grains are secondary particles associated with primary particles, and the ratio d2/d1 of mean particle diameter d2 of the secondary particles to mean particle diameter d1 of the primary particles is 1.6 or larger.;COPYRIGHT: (C)2007,JPO&INPIT
机译:解决的问题:提供可以有效地在III族氮化物晶体上形成几乎没有潜在缺陷的光滑表面的抛光浆料,并提供使用抛光浆料的III族氮化物晶体的表面处理方法。在对第III族氮化物晶体的表面进行化学机械抛光时,其硬度不高于第III族氮化物晶体的硬度的硬度(其中,这些磨粒为与一次粒子相关的二次粒子),且比率d 2 2 的Sub> / d 1 与初级粒子的平均粒径d 1 为1.6或更大。;版权:(C)2007,日本特许厅和INPIT

著录项

  • 公开/公告号JP2007103457A

    专利类型

  • 公开/公告日2007-04-19

    原文格式PDF

  • 申请/专利权人 SUMITOMO ELECTRIC IND LTD;

    申请/专利号JP20050288224

  • 发明设计人 ISHIBASHI KEIJI;NISHIURA TAKAYUKI;

    申请日2005-09-30

  • 分类号H01L21/304;B24B37/00;C09K3/14;

  • 国家 JP

  • 入库时间 2022-08-21 21:12:42

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