SEMICONDUCTOR STORAGE DEVICE, SEMICONDUCTOR STORAGE DEVICE FUNCTIONAL TEST METHOD, AND ELECTRONIC DEVICE COMPRISING SEMICONDUCTOR STORAGE DEVICE

摘要

PPROBLEM TO BE SOLVED: To accurately detect crosstalk and garbled data under the influence of noise by using an address and data created by random numbers in verification of address, data bus and system bus in a semiconductor storage device and an electronic device comprising the semiconductor storage device. PSOLUTION: The semiconductor storage device which detects a functional disorder produced in specific bit array by writing data of random number address written by pseudo-random number generator 2 in a semiconductor storage devices A-1, A-2, A-XXX, B-1, B-2, B-XXX, X-1, X-2, X-XXX, reading data of random number address written in the semiconductor storage devices A-1, A-2, A-XXX, B-1, B-2, B-XXX, X-1, X-2, X-XXX, and comparing read data and written data through compare means, the semiconductor storage device functional test method therefor, and an electronic device having the semiconductor storage device are provided. PCOPYRIGHT: (C)2007,JPO&INPIT