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Thin plate-like semiconductor component inspection classification system of
Thin plate-like semiconductor component inspection classification system of
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机译:薄板状半导体元器件检查分类系统
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摘要
PROBLEM TO BE SOLVED: To improve operating efficiency by shortening the time until classifying and storing a solar battery cell 30 for each rank on the basis of the ranking result by an inspection device 21. SOLUTION: An operation of storing the solar battery cell 30 conveyed successively into a storing part 23 and an operation of taking out the solar battery cell from a conveying part 25 can be simultaneously carried out, because the solar battery cell 30 can be temporarily stored into a buffer part 31 of a stock part 24 from a conveying part 25 through an intake means 34. Thereby, the solar battery cell 30 can be taken out from the inspection device 21 in spite of storing the solar battery cell 30 in the storing part 23. Accordingly, the solar battery cell 30 can be stored in the storing part 23 without stopping a first conveying means 22 and the intake means 34, and thus the operation rate of the device can be improved.
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