Semiconductor integrated circuit which can be burn-in-tested even when packaged and method of burn-in-testing semiconductor integrated circuit even when the semiconductor integrated circuit is packaged

摘要

A semiconductor integrated circuit and method for burn-in-testing are provided that uniformly apply stress to elements of the semiconductor integrated circuit in a burn-in test mode, even when packaged. The semiconductor integrated circuit may include a transmission control unit that transmits an operation signal in a normal operating mode and blocks the operation signal in the test mode; and a test control unit that sequentially outputs a first signal and a second signal to an input/output (I/O) circuit in the test mode.