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Method and apparatus for reducing leakage current in a read only memory device using shortened precharge phase
Method and apparatus for reducing leakage current in a read only memory device using shortened precharge phase
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机译:用于使用缩短的预充电阶段减小只读存储装置中的泄漏电流的方法和设备
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摘要
A method and apparatus are provided for reducing leakage current in a read only memory device. Leakage current is reduced by reducing the duration of the precharge cycle during each read cycle so that the associated leakage current will flow for a shorter time period during each cycle. The precharge phase is positioned at the beginning of each read cycle, prior to the evaluation phase. The precharge phase is terminated by a subsequent clock edge or by an internal time out prior to a subsequent clock edge. The time interval between when the columns reach their precharge voltage and the evaluation phase begins is reduced.
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