首页> 外国专利> METHOD OF FABRICATING LOW-DIELECTRIC CONSTANT INTERLEVEL DIELECTRIC FILMS FOR BEOL INTERCONNECTS WITH ENHANCED ADHESION AND LOW-DEFECT DENSITY

METHOD OF FABRICATING LOW-DIELECTRIC CONSTANT INTERLEVEL DIELECTRIC FILMS FOR BEOL INTERCONNECTS WITH ENHANCED ADHESION AND LOW-DEFECT DENSITY

机译:具有高附着力和低缺陷密度的Beol互连的低介电常数层间介电薄膜的制造方法

摘要

A substantially defect-free, low-k dielectric film having improved adhesion is provided by (a) applying a silane coupling agent containing at least one polymerizable group to a surface of a substrate so as to provide a substantially uniform coating of said silane-coupling agent on said substrate; (b) heating the substrate containing the coating of the silane-coupling agent at a temperature of about 90°C or above so as to provide a surface containing Si-O bonds; (c) rinsing the heated substrate with a suitable solvent that is effective in removing any residual silane-coupling agent; and (d) applying a dielectric material to the rinsed surface containing the Si-O bonds.
机译:通过(a)将包含至少一个可聚合基团的硅烷偶联剂施加到基底的表面上以提供基本上均匀的所述硅烷偶联剂的涂层,从而提供具有改善的粘附力的基本上无缺陷的低k介电膜。所述基质上的试剂; (b)在约90℃或更高的温度下加热包含硅烷偶联剂涂层的基材,以提供包含Si-O键的表面; (c)用能有效除去任何残留硅烷偶联剂的合适溶剂冲洗加热的基材; (d)将电介质材料施加到含有Si-O键的冲洗过的表面上。

著录项

  • 公开/公告号IL157506B

    专利类型

  • 公开/公告日2007-06-03

    原文格式PDF

  • 申请/专利权人 IBM CORPORATION;

    申请/专利号IL157506

  • 发明设计人

    申请日2003-08-21

  • 分类号H01L21/312;H01L21/768;

  • 国家 IL

  • 入库时间 2022-08-21 20:58:39

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