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CO-INTEGRATION OF MULTI-GATE FET WITH OTHER FET DEVICES IN CMOS TECHNOLOGY

机译:CMOS技术中多栅极FET与其他FET器件的共集成

摘要

The present invention relates to a CMOS circuit device on a SOI substrate with an oriented silicon surface, comprising on a first substrate region a FET that has a FET channel region of a first conductivity type, and comprising on a second substrate region a FinFET that has a FinFET channel region of a second conductivity type which is opposite to the first conductivity type. The invention also relates to a method for fabricating such a CMOS circuit device. The fabrication of the multi-gate planar FET comprises, at an intermediate step, forming a FET channel stack with an alternating sequence of layers of a FET material and of a sacrificial material and containing main FET -channel faces, which have the same orientation as the oriented silicon surface. According to the invention, a co-integration of multi-gate FET devices is achieved that ensures high carrier mobilities for both NMOS and PMOS FETs.
机译:本发明涉及在具有取向的硅表面的SOI衬底上的CMOS电路器件,其包括在第一衬底区域上的FET,该FET具有第一导电类型的FET沟道区域,并且在第二衬底区域上包括FinFET,其具有第二导电类型的FinFET沟道区域与第一导电类型相反。本发明还涉及一种用于制造这种CMOS电路器件的方法。多栅平面型FET的制造包括在中间步骤中形成FET沟道叠层,该FET沟道叠层具有FET材料和牺牲材料交替排列的层序列,并包含与FET沟道主面相同的主FET沟道面。取向的硅表面。根据本发明,实现了多栅极FET器件的共集成,其确保了对于NMOS和PMOS FET两者的高载流子迁移率。

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