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Operating techniques for reducing effects of coupling between storage elements of a non-volatile memory in multiple-data states

机译:用于减少多数据状态下非易失性存储器的存储元件之间耦合的影响的操作技术

摘要

A non-volatile memory system having an array of memory cells with at least one storage element each is operated with a plurality of storage level ranges per storage element. A flash electrically erasable and programmable read only memory (EEPROM) is an example, wherein the storage elements are electrically floating gates. The memory is operated to minimize the effect of charge coupled between adjacent floating gates, by programming some cells a second time after adjacent cells have been programmed. The second programming step also compacts a distribution of charge levels within at least some of the programming states. This increases the separation between states and/or allows more states to be included within a given storage window. An implementation that is described is for a NAND type of flash EEPROM.
机译:一种具有存储单元阵列的非易失性存储系统,每个存储单元具有至少一个存储元件,每个存储元件具有多个存储级别范围。闪存电可擦除可编程只读存储器(EEPROM)是一个示例,其中存储元件是电浮栅。通过在对相邻单元进行编程之后第二次对一些单元进行编程,来操作存储器以最小化耦合在相邻浮栅之间的电荷的影响。第二编程步骤还压缩至少一些编程状态内的电荷水平分布。这增加了状态之间的间隔和/或允许在给定的存储窗口内包含更多状态。所描述的实现是针对NAND类型的闪存EEPROM。

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