首页> 外国专利> Noninvasive system of measuring ion energy distribution for plasma apparatus and method of measuring ion energy distribution using the same

Noninvasive system of measuring ion energy distribution for plasma apparatus and method of measuring ion energy distribution using the same

机译:用于等离子体设备的离子能量分布的无创测量系统以及使用该系统的离子能量分布测量方法

摘要

The present invention is a plasma generating means for generating a plasma within the chamber portion, and part of the chamber comprising an electrode which relates to ion energy distribution measurement method using noninvasive ion energy distribution measurement system for a plasma device, and this, the substrate is mounted and , and bias application means for applying a bias potential to the electrode, is connected to a bias potential measurement means, means said chamber portion and said plasma generation for measuring the bias potential applied to the electrode process for measuring a process variable measuring a variable measuring means and the ion energy distribution with a bias potential and the parameters, and provides a noninvasive measure ion energy distribution system for a plasma device comprising a control and analysis to control the operation of the measuring means. It without direct contact with the plasma through a process variable measured in the external chamber, and measuring the plasma potential by a bias electrode potential, it is possible to measure the plasma ion energy distribution in real time. ; Plasma, ion energy, non-contact, and a bias, etching, plasma potential
机译:本发明是一种用于在腔室部分内产生等离子体的等离子体产生装置,并且该腔室的一部分包括电极,该电极与使用用于等离子体装置的非侵入性离子能量分布测量系统的离子能量分布测量方法有关,该基板安装并安装有用于将偏置电位施加到电极的偏置施加装置,该偏置施加装置连接到偏置电位测量装置,该装置用于测量施加到电极上的偏置电位的所述腔室部分和所述等离子体产生,用于测量工艺变量测量可变的测量装置以及具有偏置电势和参数的离子能量分布,并且提供了一种用于等离子体装置的非侵入性测量离子能量分布系统,该系统包括控制和分析以控制测量装置的操作。通过在外部腔室中测得的过程变量不与等离子体直接接触,而通过偏置电极电势来测量等离子体电势,则可以实时测量等离子体离子能量分布。 ;等离子体,离子能量,非接触式和偏置,蚀刻,等离子体电势

著录项

  • 公开/公告号KR20070019297A

    专利类型

  • 公开/公告日2007-02-15

    原文格式PDF

  • 申请/专利权人 주성엔지니어링(주);

    申请/专利号KR20050074119

  • 发明设计人 권기청;정진욱;오세진;

    申请日2005-08-12

  • 分类号H01L21/02;H01L21/3065;H01L21/205;

  • 国家 KR

  • 入库时间 2022-08-21 20:36:50

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