首页> 外国专利> FABRICATION METHOD FOR P-TYPE ZINC OXIDE THIN FILMS BY ATOMIC LAYER DEPOSITION

FABRICATION METHOD FOR P-TYPE ZINC OXIDE THIN FILMS BY ATOMIC LAYER DEPOSITION

机译:原子层沉积制备p型氧化锌薄膜的方法

摘要

A method for manufacturing a P type zinc oxide thin film is provided to improve optical, structural and electrical characteristics by forming the zinc oxide thin film using an ALD(Atomic Layer Deposition) and performing a heat treatment process on the zinc oxide thin film. First species containing zinc are deposited on a substrate by supplying a zinc source. Second species containing oxygen are deposited on the first species by supplying an oxygen source onto the resultant structure. The resultant structure is doped with third species containing nitrogen by supplying a nitrogen source as a dopant source. A post-heat treatment process is performed on the resultant structure under oxygen gas atmosphere to form a hole thereon.
机译:提供一种制造P型氧化锌薄膜的方法,以通过使用ALD(原子层沉积)形成氧化锌薄膜并在氧化锌薄膜上进行热处理工艺来改善光学,结构和电特性。通过供应锌源,将含锌的第一物质沉积在基底上。通过将氧气源供应到所得结构上,将含氧的第二物种沉积在第一物种上。通过提供氮源作为掺杂剂源,将所得结构掺杂有含氮的第三种物质。在氧气气氛下对所得结构进行后热处理工艺以在其上形成孔。

著录项

  • 公开/公告号KR20070026908A

    专利类型

  • 公开/公告日2007-03-09

    原文格式PDF

  • 申请/专利权人 INHA-INDUSTRY PARTNERSHIP INSTITUTE;

    申请/专利号KR20050079102

  • 发明设计人 LEE CHONG MU;LIM JONG MIN;

    申请日2005-08-27

  • 分类号H01L21/205;

  • 国家 KR

  • 入库时间 2022-08-21 20:36:25

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