首页> 外国专利> FABRICATION METHOD OF SEMICONDUCTOR DEVICE HAVING STORAGE CAPACITOR AND HIGH VOLTAGE RESISTANCE CAPACITOR AND SEMICONDUCTOR DEVICE FABRICATED USING THE SAME

FABRICATION METHOD OF SEMICONDUCTOR DEVICE HAVING STORAGE CAPACITOR AND HIGH VOLTAGE RESISTANCE CAPACITOR AND SEMICONDUCTOR DEVICE FABRICATED USING THE SAME

机译:具有相同存储电容和高耐压电容的半导体装置的制造方法

摘要

A method for fabricating a semiconductor device having a storage capacitor and a high voltage resistance capacitor is provided to fabricate different kinds of capacitors in a semiconductor device by forming capacitors satisfying different electrical requirements in the same layer without greatly increasing the number of process steps. A substrate(100) is prepared in which a storage capacitor region and a high voltage resistance capacitor region are included. A lower electrode layer is formed on the capacitor regions. A first dielectric layer(121) is formed on the lower electrode layer. The first dielectric layer in the storage capacitor region is selectively removed to expose the lower electrode layer in the storage capacitor region. A second dielectric layer(123) is formed on the lower electrode layer and the first dielectric layer in the exposed storage capacitor region. The first and second dielectric layers can be made of the same material layer like a SiO2 layer. An upper electrode layer is formed on the second dielectric layer. A third dielectric layer(125) is formed on the second dielectric layer.
机译:提供一种用于制造具有存储电容器和高耐压电容器的半导体器件的方法,以通过在同一层中形成满足不同电学要求的电容器而在半导体器件中制造不同种类的电容器而不会大大增加工艺步骤的数量。准备衬底(100),其中包括存储电容器区和高压电阻电容器区。在电容器区域上形成下部电极层。在下部电极层上形成第一介电层(121)。选择性地去除存储电容器区域中的第一电介质层以暴露存储电容器区域中的下电极层。在暴露的存储电容器区域中的下电极层和第一介电层上形成第二介电层(123)。第一和第二介电层可以由与SiO 2层相同的材料层制成。上电极层形成在第二介电层上。在第二介电层上形成第三介电层(125)。

著录项

  • 公开/公告号KR20070076252A

    专利类型

  • 公开/公告日2007-07-24

    原文格式PDF

  • 申请/专利权人 SAMSUNG ELECTRONICS CO. LTD.;

    申请/专利号KR20060005413

  • 发明设计人 SHIN HWA SOOK;

    申请日2006-01-18

  • 分类号H01L27/04;

  • 国家 KR

  • 入库时间 2022-08-21 20:33:56

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号