首页> 外国专利> ANALYZING CHAMBER INCLUDING A LEAKAGE ION BEAM DETECTOR AND MASS ANALYZER INCLUDING THE SAME

ANALYZING CHAMBER INCLUDING A LEAKAGE ION BEAM DETECTOR AND MASS ANALYZER INCLUDING THE SAME

机译:包含泄漏离子束检测器的分析腔和包含相同离子束的质量分析器

摘要

The mass spectrometry appointed chamber that can detect ion leakage is disclosed. The mass analysis appointed chamber comprises a body having an internal passage through which the ion beam is between the inlet, outlet to which the ion beam is emitted and the inlet and outlet to be the ion beam is incident. Shielding portion is arranged to prevent along the inner wall of the main body which defines the internal passageway within said sidewall from the ion beam passing through the inside of the main body is damaged. The shielding section and the by the detector capable of detecting the ion beam to reach the inner wall positioned between the inner wall of the main body to sense the ion beam from leaking from the shielding portion. Accordingly, the inner wall of the main body from leaking from the ion beam by the shielding parts of the wear can be prevented from being damaged.
机译:公开了一种可以检测离子泄漏的质谱指定室。质量分析指定室包括具有内部通道的主体,离子束通过内部通道进入离子束的入口,出口与要入射的离子束的入口和出口之间。屏蔽部被布置成防止沿着限定在所述侧壁内的内部通道的主体的内壁受到穿过主体内部的离子束的损坏。屏蔽部和检测器能够检测离子束到达位于主体的内壁之间的内壁,以检测离子束是否从屏蔽部泄漏。因此,可以防止由于磨损的遮蔽部分而导致的主体的内壁从离子束泄漏而被损坏。

著录项

  • 公开/公告号KR100684105B1

    专利类型

  • 公开/公告日2007-02-16

    原文格式PDF

  • 申请/专利权人

    申请/专利号KR20050066517

  • 申请日2005-07-22

  • 分类号G01N27/62;

  • 国家 KR

  • 入库时间 2022-08-21 20:32:54

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