首页> 外国专利> SURFACE DEFECT DETECTING APPARATUS FOR PCB AND METHOD FOR SURFACE DEFECT DETECTING OF PCB USING THE SAME

SURFACE DEFECT DETECTING APPARATUS FOR PCB AND METHOD FOR SURFACE DEFECT DETECTING OF PCB USING THE SAME

机译:用于PCB的表面缺陷检测装置以及使用该表面缺陷检测方法的PCB的表面缺陷

摘要

A surface defect detecting apparatus for a PCB(Printed Circuit Board) and a method for detecting a surface defect of the PCB using the same are provided to detect a fine defect quickly by performing a surface defect detection through a plurality of matrix shape height measuring units. In a surface defect detecting apparatus for a PCB, a height measuring unit(100) forms voltage data per each position coordinate value by contacting a plurality of height measurers, arranged as a matrix shape, with a surface of the PCB on which a circuit pattern is formed at once. A data transformer(200) transforms the voltage data to a digital signal. A database(400) stores reference data. A defect detecting unit(500) compares the digital signal with the reference data and detects/outputs a defect. The height measurer comprises a probe which is contacted with a surface of the PCB and moves vertically toward the PCB surface, a piezoelectric sensor which converts a pressure generated from a movement of the probe to the voltage data, and a signal amplifier which amplifies the voltage data.
机译:提供了一种用于PCB(印刷电路板)的表面缺陷检测设备以及使用该表面缺陷检测设备的用于检测PCB的表面缺陷的方法,以通过通过多个矩阵形状高度测量单元执行表面缺陷检测来快速检测细微缺陷。 。在用于PCB的表面缺陷检测设备中,高度测量单元(100)通过使布置成矩阵形状的多个高度测量器与PCB的其上具有电路图案的表面接触来形成每个位置坐标值的电压数据。立刻形成。数据转换器(200)将电压数据转换成数字信号。数据库(400)存储参考数据。缺陷检测单元(500)将数字信号与参考数据进行比较,并检测/输出缺陷。高度测量器包括与PCB的表面接触并垂直向PCB表面移动的探头,将探头运动产生的压力转换为电压数据的压电传感器以及放大电压的信号放大器数据。

著录项

  • 公开/公告号KR100688870B1

    专利类型

  • 公开/公告日2007-03-02

    原文格式PDF

  • 申请/专利权人 SAMSUNG ELECTRO-MECHANICS CO. LTD.;

    申请/专利号KR20050086250

  • 发明设计人 AUM JAE GOON;KIM KI HONG;

    申请日2005-09-15

  • 分类号H05K13/08;

  • 国家 KR

  • 入库时间 2022-08-21 20:32:48

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