Grading Method of Kiwifruit Based on Surface Defect Recognition

摘要

Aiming at the problems of single classification method and high classification cost of kiwifruit in China,we proposed a grading method based on kiwifruit surface defects.A set of kiwifruit image acquisition system was built.The K-means clustering segmentation algorithm was used to segment the surface defects,and then color contrast was performed to determine whether it was a piece of defective fruit.Then,the shape features of normal fruit were extracted and an SVM classifier was designed to further determine its grade.This method has the advantages of low cost,simple algorithm and high efficiency,which opens a new way for fruit classification,and is of great significance to promoting the development of fruit classification industry in China and enhancing international competitiveness.