SORTING HANDLER FOR BURN-IN TEST HAVING SORTING TRAY STACKING PART FOR STACKING SORTING TRAYS AND METHOD FOR SORTING SEMICONDUCTOR DEVICE USING THE HANDLER

摘要

A sorting handler for a burn-in test having a sorting tray stacking part for transferring and stacking sorting trays and a semiconductor device sorting method using the same are provided to perform sorting work without stopping equipment even if devices are fully filled in a tray, and to increase operation efficiency of the sorting handler by transferring the sorting tray from a sorting part to the sorting tray stacking part. A sorting handler for a burn-in test is composed of a burn-in board(1) in which completely tested devices(10) are stacked; a tray loading part(2) loading devices to be tested; a tray unloading part(3) loading good devices sorted from the burn-in board; a sorting part(6) comprising trays loading inferior products classified after executing a burn-in test or a DC(Direct Current) test, according to each grade; a tray transfer(8) transferring the empty tray generated from the tray loading part to the tray unloading part; and a sorting tray stacking part(9) installed at a moving path of the tray transfer to stack sorting trays fully filled with the devices in order. The tray transfer delivers each tray of the sorting part to the sorting tray stacking part.