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Semiconductor component with retrograde doping profile in a channel region and a method for producing the same

机译:在沟道区中具有反向掺杂分布的半导体组件及其制造方法

摘要

A process for producing a retrograde doping profile in a channel region (336, 346) of a field effect transistor (330, 340), said method comprising:Forming a potential well structure (310, 320) in a substrate;epitaxially growing a channel layer (350) on the potential well structure (310, 320), wherein a doping concentration in the channel layer (350) is less than a doping concentration in the potential well structure (310, 320) is;Adjustment of the retrograde doping profile in the channel layer (350) by controlling the process parameters during the epitaxial growth of the channel layer (350) and / or by controlling the process parameters during the implantation of ions and / or by providing a barrier diffusion layer (351);Forming a gate insulation film (335) and a gate electrode (334, 344) on the channel layer (350); andForming a drain - and a source region (331, 341) in the potential well structure (310, 320), wherein the channel region (336, 346) between the drain region (331, 341) and the source region (331, 341) is arranged.
机译:一种在场效应晶体管(330、340)的沟道区(336、346)中产生逆向掺杂分布的方法,所述方法包括:在衬底中形成势阱结构(310、320);外延生长沟道势阱结构(310、320)上的掺杂层(350),其中沟道层(350)中的掺杂浓度小于势阱结构(310、320)中的掺杂浓度;逆向掺杂分布的调整通过在沟道层(350)的外延生长期间控制工艺参数和/或通过在离子注入期间控制工艺参数和/或通过提供势垒扩散层(351)在沟道层(350)中形成;沟道层(350)上的栅绝缘膜(335)和栅电极(334、344);在势阱结构(310、320)中形成漏极-和源极区(331、341),其中,漏极区(331、341)和源极区(331、341)之间的沟道区(336、346) )。

著录项

  • 公开/公告号DE10214066B4

    专利类型

  • 公开/公告日2007-02-01

    原文格式PDF

  • 申请/专利权人

    申请/专利号DE2002114066

  • 发明设计人

    申请日2002-03-28

  • 分类号H01L21/336;H01L29/78;

  • 国家 DE

  • 入库时间 2022-08-21 20:30:11

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