首页> 外国专利> Measuring arrangement e.g. computed tomography measuring arrangement, calibrating method, involves determining geometry parameter of geometrical model, which describes geometry of arrangement, by evaluation of radiographic image

Measuring arrangement e.g. computed tomography measuring arrangement, calibrating method, involves determining geometry parameter of geometrical model, which describes geometry of arrangement, by evaluation of radiographic image

机译:测量装置计算机断层扫描测量装置,校准方法,涉及通过评估放射线图像确定几何模型的几何参数,该几何参数描述了装置的几何形状

摘要

The method involves penetrating an invasive radiation into a calibrating object and detecting resulting radiation of a detection unit (3) of a measuring arrangement. A radiographic image of the object is produced from detection signals that correspond to the detected radiation. A geometry parameter of a geometrical model, which describes geometry of the arrangement, is determined by evaluation of the radiographic image. Independent claims are also included for the following: (1) a calibrating object for calibrating a measuring arrangement (2) an arrangement for calibrating a measuring arrangement comprising a calibrating object.
机译:该方法包括将侵入性辐射穿透到校准物体中并检测测量装置的检测单元(3)的所得辐射。物体的射线照相图像由与检测到的辐射相对应的检测信号产生。通过射线照相图像的评估来确定描述布置的几何形状的几何模型的几何参数。还包括以下独立权利要求:(1)用于校准测量装置的校准物体(2)用于校准包括校准物体的测量装置的装置。

著录项

  • 公开/公告号DE102005033187A1

    专利类型

  • 公开/公告日2007-01-25

    原文格式PDF

  • 申请/专利权人 CARL ZEISS INDUSTRIELLE MESSTECHNIK GMBH;

    申请/专利号DE20051033187

  • 发明设计人 WEISS DANIEL;

    申请日2005-07-13

  • 分类号G01N23/083;G06T7/00;

  • 国家 DE

  • 入库时间 2022-08-21 20:29:55

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