Surface weight or chemical composition determination procedure uses primary high energy X rays to generate secondary emission of material sample and converter

摘要

A surface weight or chemical composition determination procedure uses primary high energy X rays (20), which interact with a moving (60) material sample (5) and a radiation converter behind it, to produce secondary radiation emissions respectively scattered by the material and transmitted to a detector (30) which separates them using energy specific and material spectrum filtering (80). Independent claims are included for equipment using the procedure.