Electronic test apparatus e.g. for testing circuits, has clock signal generator and driver having several subunits each generating phase-shifted driver signal in response to clock signal

摘要

The electronic test apparatus (100) has a clock signal generator (301) and a driver (602) has several subunits (302a-302k) each generating a phase-shifted driver signal in response to the clock signal. The phase-shifted driver signals (304a-304k) are processed and actual data being output by a circuit unit is compared with desired data generated in a processor (201). The processor is connected to the circuit unit and transmits the phase-shifted driver signals, the desired data, and the actual data between the processor and the circuit unit. An independent claim is included for a method for testing a circuit unit.