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The contact piece, the contact arrangement with contact pieces, samples card, a testing apparatus and method and apparatus for the production of the contact arrangement

机译:接触件,具有接触件的接触装置,样品卡,测试设备以及用于制造接触装置的方法和设备

摘要

Contact piece (50), suitable for the production of an electrical contact with a tested component (200) when the component is tested in that a contact provided on the structural component (210) is contacted with:a with a graduation (52) provided with a base (51),a supporting part (53) arranged on the base with a rear end and a of the base projecting front end, anda formed on the surface of the support part and the contact (210) electrically contacting conductive part (54),one edge (52a, 52b) of the base (51) on the step formed (52) the surface of a the contact piece, which holds the contact plate (40) is in contact with such a way that a predetermined angle of inclination (β) between the surface of the contact plate and the supporting part is defined.
机译:接触件(50),适用于在对部件进行测试时与被测部件(200)进行电接触,因为结构部件(210)上提供的触点与以下部件接触:a带有刻度(52)带有基座(51),布置在基座上的支撑部分(53),其后端和基座伸出的前端a,以及形成在支撑部分和与导电部分电接触的触点(210)的表面上的(在图54中),在形成在接触片(52)的表面上的台阶(52)上,基部(51)的一个边缘(52a,52b)以保持预定角度的方式接触。限定了接触板的表面与支撑部之间的倾斜度(β)。

著录项

  • 公开/公告号DE112005000233T5

    专利类型

  • 公开/公告日2007-10-04

    原文格式PDF

  • 申请/专利权人

    申请/专利号DE20051100233T

  • 发明设计人

    申请日2005-06-27

  • 分类号G01R31/28;

  • 国家 DE

  • 入库时间 2022-08-21 20:29:35

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