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A method for calculating a model spectrum
A method for calculating a model spectrum
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机译:一种模型光谱的计算方法
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摘要
In the case of technical surfaces, in particular in the field of semiconductor production, it is frequently necessary to determine the reflection coefficients. For this purpose, a model of an object from a plurality of wavelengths, and a defined number of interpolation points is calculated. In order to increase the speed in the calculation, before carrying out the calculation of the defined number of interpolation points is calculated.
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