首页> 外国专利> Calibration standard to calibrate devices for non-destructively measuring thickness of thin layers has standard with bearing surface plane-parallel with its measuring surface and permanently provided on carrier layer by plating via rubbing

Calibration standard to calibrate devices for non-destructively measuring thickness of thin layers has standard with bearing surface plane-parallel with its measuring surface and permanently provided on carrier layer by plating via rubbing

机译:用于无损测量薄层厚度的校准设备的校准标准的标准是,轴承表面与测量表面平行,并通过摩擦镀覆永久性地提供在载体层上

摘要

A calibration standard has a carrier layer (12) with a basic material and having a measuring surface (16) plane-parallel to its bearing surface (14); a standard (17) applied on carrier layer and having a bearing surface (18) plane-parallel with its measuring surface (19) for bearing on measuring surface of carrier layer; and an auxiliary pole (21) with a contact surface (23) plane-parallel to measuring surface of standard. The standard is permanently provided on carrier layer by plating via rubbing; and is surrounded by a frame.
机译:校准标准具有载体层(12),该载体层具有基础材料并且具有平行于其承载面(14)的测量面(16)。标准(17),其施加在载体层上,并且具有与其测量表面(19)平面平行的支承表面(18),用于支承在载体层的测量表面上;辅助极(21)具有与标准测量表面平面平行的接触表面(23)。通过摩擦电镀将标准永久提供在载体层上;并被一个框架包围。

著录项

  • 公开/公告号DE102006028135A1

    专利类型

  • 公开/公告日2006-12-28

    原文格式PDF

  • 申请/专利号DE20061028135

  • 发明设计人

    申请日2006-06-16

  • 分类号G01B7/06;

  • 国家 DE

  • 入库时间 2022-08-21 20:29:12

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