首页> 外国专利> Non-volatile memory unit e.g. flash memory unit, has word line voltage generator generating voltage impulse sequences, where increase of voltage impulse of one of sequences is higher than increase of voltage impulse of another sequence

Non-volatile memory unit e.g. flash memory unit, has word line voltage generator generating voltage impulse sequences, where increase of voltage impulse of one of sequences is higher than increase of voltage impulse of another sequence

机译:非易失性存储单元闪存单元,具有字线电压产生器,其产生电压脉冲序列,其中一个序列的电压脉冲的增加高于另一序列的电压脉冲的增加

摘要

The memory unit has a word line voltage generator (1750) generating two voltage impulse sequences and creating the voltage impulse sequences selectively at selected word lines to program non-volatile memory cells. The memory cells are connected with the selected word line. An increase of a voltage impulse of one of the voltage impulse sequences is higher than an increase of a voltage impulse of another voltage impulse sequence. Independent claims are also included for the following: (1) a method for programming a non-volatile memory unit (2) a memory system with a non-volatile memory unit.
机译:该存储单元具有字线电压产生器(1750),该字线电压产生器产生两个电压脉冲序列,并在选择的字线上选择性地产生电压脉冲序列,以对非易失性存储单元进行编程。存储单元与所选字线连接。其中一个电压脉冲序列的电压脉冲的增加高于另一个电压脉冲序列的电压脉冲的增加。还包括以下各项的独立权利要求:(1)一种用于对非易失性存储单元进行编程的方法(2)具有非易失性存储单元的存储系统。

著录项

  • 公开/公告号DE102006035241A1

    专利类型

  • 公开/公告日2007-02-01

    原文格式PDF

  • 申请/专利权人 SAMSUNG ELECTRONICS CO. LTD.;

    申请/专利号DE20061035241

  • 发明设计人 HWANG SANG-WON;LEE JIN-WOOK;

    申请日2006-07-26

  • 分类号G11C16/12;G11C16/08;

  • 国家 DE

  • 入库时间 2022-08-21 20:29:14

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