首页> 外国专利> Electron beam radiation device, has deviation control that initiates deflector and deviates electron beam produced from electron gun based on deviation amount of electron beam, and deflector that diffracts electron beam

Electron beam radiation device, has deviation control that initiates deflector and deviates electron beam produced from electron gun based on deviation amount of electron beam, and deflector that diffracts electron beam

机译:电子束辐射装置,具有基于电子束的偏移量来启动偏转器并使电子枪产生的电子束偏离的偏离控制,以及使电子束衍射的偏转器。

摘要

The device has an electron gun (101) for producing an electron beam, a deflector for diffracting the beam, and a semiconductor wafer platform, on which a semiconductor wafer is placed. A platform position detector finds the position of the platform. A platform position computing unit for computing the motion speed of the platform, based on a distance over which the platform moves and on a time required to move the platform over the distance. A deviation control initiates the deflector, and deviates the beam based on the deviation amount of the beam. The computing unit is also provided for computing the amount of position change of the platform with respect to an interpolation time.
机译:该装置具有用于产生电子束的电子枪(101),用于使束发生衍射的偏转器以及在其上放置半导体晶片的半导体晶片平台。平台位置检测器可以找到平台的位置。平台位置计算单元,用于基于平台移动的距离和在该距离上移动平台所需的时间来计算平台的运动速度。偏差控制启动偏转器,并根据光束的偏差量使光束偏转。还提供计算单元,用于计算平台相对于插值时间的位置变化量。

著录项

  • 公开/公告号DE102007014301A1

    专利类型

  • 公开/公告日2007-10-31

    原文格式PDF

  • 申请/专利权人 ADVANTEST CORP.;

    申请/专利号DE20071014301

  • 发明设计人 SATOH TAKAMASA;OOAE YOSHIHISA;

    申请日2007-03-26

  • 分类号H01J37/304;H01J37/30;

  • 国家 DE

  • 入库时间 2022-08-21 20:29:06

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