首页>
外国专利>
POSITION SPECIFYING METHOD FOR DEFORMATION MAP, POSITION SPECIFYING SYSTEM FOR THE DEFORMATION MAP, POSITION SPECIFYING METHOD FOR MEASUREMENT MAP, AND POSITION SPECIFYING SYSTEM FOR MEASUREMENT MAP
POSITION SPECIFYING METHOD FOR DEFORMATION MAP, POSITION SPECIFYING SYSTEM FOR THE DEFORMATION MAP, POSITION SPECIFYING METHOD FOR MEASUREMENT MAP, AND POSITION SPECIFYING SYSTEM FOR MEASUREMENT MAP
PROBLEM TO BE SOLVED: To provide coordinate information of a measurement map on a deformation map by making both control point coordinates of the measurement map and of the deformation map mutually convertible.;SOLUTION: The position specifying method for deformation map includes a step for receiving a first coordinate information of a mobile terminal (20) from the mobile terminal (20); a step extracting a first control point of a measurement map near first coordinate information from the measurement map; a step for selecting a second control point of a deformation map, corresponding to the first control point from the deformation map: and a step for calculating second coordinate information of mobile terminal on the deformation map, by calculating interpolation from first coordinate information, the first control point and the second control point.;COPYRIGHT: (C)2008,JPO&INPIT
展开▼